Demie Kepaptsoglou
Senior Research Fellow - Lecturer & Deputy Director / Staff Scientist – SuperSTEM facility

Profile

Biography

• MScEng (NTUA, Greece)
• PhD (NTUA, Greece)

Career

2017

Research Fellow - Lecturer

Deputy Director & Staff Scientist – SuperSTEM facility

EPSRC National Facility for Advanced Electron Microscopy

2011-2017

Staff Scientist, SuperSTEM facility, UK

School of Materials, University of Manchester

2007-2011

Postdoctoral Researcher

Institute of Physics, University of Oslo, Norway

2006-2007

Engineering Consultant

2002-2006

Young Researcher, School of Mining & Metallurgy Engineering,

National Technical University of Athens, Greece

Research

Overview

Research Interests:

• Development and application of electron microscopy and spectroscopy techniques for materials science applications
• Scanning Transmission Electron Microscopy (STEM), Electron Energy Loss spectroscopy (EELS)
• Nanomaterials, thermoelectrics, topological insulators, functional oxides, graphene & 2D materials
  Defects and interfaces in functional materials

Projects

• Proximity effects in Topological Insulators & 2D materials interfaces
• Structure and electronic structure at spin-to-charge conversion interfaces
• Development of vibrational and magnon spectroscopy in an electron microscope

Research group(s)

• Condensed Matter Physics
• York Nanocentre

Grants

• New Horizons 2020: Seeing magnons at spin-to-charge conversion interfaces

Supervision

• Connor Murrill (co supervision with Prof V. Lazarov)
• Fayzah Talbi (co supervision with Prof V. Lazarov)

External activities

Memberships

• Technical Chamber of Greece (TEE-TCG)
• Greek Women’s Engineering Association (EDEM)
• Institute of Physics (IOP) / Electron Microscopy and Analysis Group (EMAG)
• Microscopy Society of America (MSA)
• European Microscopy Society
• Royal Microscopical Society

Invited talks and conferences

• D.M. Kepaptsoglou, et al Applications of Aberration Corrected STEM, International conference in Applied Physics of Condensed Matter, Štrbské Pleso, High Tatras, Slovakia 2012
• D.M Kepaptsoglou, et, al, Performance and Stability of Dedicated Aberration-Corrected STEMs: a User's Perspective, Microscopy and Microanalysis Conference, Hartford Connecticut, 2014
• D.M. Kepaptsoglou, Probing the chemistry of single atoms and two-dimensional materials, Frontiers of Electron Microscopy in Materials, Lake Tahoe, California, 2015
• D.M. Kepaptsoglou et al, Interfaces in Half Metal Heterostructures, International Workshop at Ringberg Castle on “New Trends in electron microscopy” , Max Planck Institute for Solid State Research, July 2016, Ringberg, Germany
• D.M. Kepaptsoglou, et al, High spatial and energy resolution
  STEM & EELS of functional oxides, 2018 MRS Spring Meeting & , Phoenix AZ, USA
• D.M. Kepaptsoglou, et al, Atomic-scale characterization of thermoelectric oxides using high spatial and energy resolution STEM-EELS, Materials Research Society Spring Meeting 2018, Phoenix AZ,
• D.M. Kepaptsoglou, et al, Applications of high spatial and energy resolution STEM-EELS, International Microscopy Congress 19, 2018, Sydney Australia
• D.M. Kepaptsoglou, et al, Single Atom Modification of 2D Materials: Fabrication & Electronic Structure, American Vacuum Society 65 international Symposium and Exhibition, October 2018. Long Beach, CA, USA
• D.M. Kepaptsoglou, et al, Single Atom Modification of 2D Materials: Fabrication & Electronic Structure, American Vacuum Society 65 international Symposium and Exhibition, October 2018. Long Beach, CA, USA
• D.M. Kepaptsoglou, et al, Single Atom Modification of 2D Materials: Fabrication & Electronic Structure, Workshop on Atom by Atom Fabrication via Electron Beams and Scanning Probes, November 2018, Oakridge National Laboratory, Knoxville, USA
• D.M. Kepaptsoglou, et. al, Atomic scale characterisation of complex oxides using STEM EELS, Electronic Materials and Applications, American Ceramic Society, 2019, Orlando, USA
• D.M. Kepaptsoglou, et al, Atomic-scale characterization of complex oxides using Scanning Electron Microscopy Transmission Electron Microscopy, ACMM26, 2020, Canberra, Australia