Imaging and Wear Analysis Lab
We carry out microscopic analysis of diverse archaeological materials, including the study of microwear traces on artefacts made from a variety of materials (eg flint, bone and ceramics) - revealing new information about how they were manufactured, used and treated in the ancient past.
The IAWA Lab contains high power Olympus and Leica metallurgical microscopes, including one with long working distance, enabling microwear analysis of wear traces on a broad range of different sized artefacts - from very small flint microliths to large grindstones and pots. An Olympus stereoscope is available for macroscopic analysis.
Our microscopes are equipped with the latest Olympus Stream image analysis software to capture publication-quality trace wear data. Our extensive reference collection of experimentally used replica tools is used regularly for microwear teaching and research purposes.
Keyence digital microscope and high power scanning electron microscope (SEM-EDS) imaging is also available in this lab.
Microscopes
- Olympus BX53M metallurgical microscopes with SC180 and DP74 cameras and Stream image analysis software
- Leica DM750P polarising microscopes with ICC50HD camera and Leica Application Suite imaging software
- Olympus IX73P2F inverted light microscope with Stream image analysis software
- A range of basic low power laboratory binocular microscopes
SEM
- Hitachi TM4000Plus Tabletop low-vacuum, 5-20kV SEM with Oxford Instruments EDS and AZtecOne analysis software
- Capable of low vacuum observation of samples up to 80mm in length without the need for sample coating. Magnification ranges from x30 to x10,000. The SEM is fitted with an Oxford Instruments EDS and AZtecOne analysis software, allowing chemical characterisation through point and area spectra, elemental mapping and line scans
Keyence VHX-X1
The Keyence VHX-X1 offers:
- Advanced imaging and analytical capabilities able to reveal even the most subtle artefact features. The digital microscope offers a 300 mm stage suitable for artefacts to facilitate non-destructive analysis.
- A large depth of field with high resolution and a range of observation modes—including brightfield, darkfield, polarisation, and differential interference contrast. The Search Lighting function combines lighting from multiple directions enabling material observations previously undetectable using conventional optical microscopes.
- Elemental Analyser (EA) enhances usability by eliminating the need for vacuum environments, conductivity treatments, cutting, or other preparatory procedures. This streamlined process simplifies material identification and enables users to obtain instant results without compromising sample integrity.
